A scanning electron microscope (SEM) is a microscope that
works by scanning a focused electron beam on a sample of interest. The main SEM
components include:
• Electronic source
• Electronic travels through electromagnetic lenses
• Electronic detectors
•Sample room
• The computer and the monitor can view the image
An electron is generated at the top of the column,
accelerating down and passing through a combination of lens and aperture to
produce a focused electron beam that strikes the surface of the sample. The
sample is mounted on the stage of the chamber area unless the microscope is
designed to operate under low vacuum, otherwise, the column and chamber are
evacuated by means of a combination of pumps. The degree of vacuum will depend
on the design of the microscope.
The position of the electron beam on the sample is
controlled by a scan coil located above the objective lens. These coils allow
the beam to be scanned on the surface of the sample. For SEM Services SEM Services in Lahore. According
to the name of the microscope, this beam scanning or scanning makes it possible
to collect information about the area defined in the sample. As a result of the
electron-sample interaction, many signals are generated. These signals are then
detected by appropriate detectors.
No comments:
Post a Comment